ISO 16610

Today, a full set of filters is described in the ISO 16610 standard series. This standard is part of the GPS standards on Geometrical Product Specification and Verification, developed by ISO TC 213.

ISO 16610 is composed of two families of documents, one for profiles (open and closed) and one for surfaces. A general introduction is provided in:

• ISO 16610-1: Overview and basic concepts (published in 2015)

The following section describes which application is suitable for each filter. References to published papers or books are provided when available. Readers are encouraged to add below proven applications related to surface texture and tribology where a particular filter can be used alone or in conjunction with other treatments or analyses to provide significant results.

Part 21 - Profile Gaussian filter

• Microroughness filtering (lambda S)
• Separation of roughness and waviness profiles (lambda C)
• Band-pass filtering

Part 22 - Profile Spline filter

Part 29 - Profile Spline wavelets

Part 31 - Profile Robust Gaussian filter

Part 41 - Profile Morphological filter

Part 45 - Profile Segmentation filter

Part 49 - Profile Scale space technique

Part 61 - Areal Gaussian filter

• Microroughness S-Filter
• L-Filter for the generation of the roughness S-L surface

Part 62 - Areal Spline filter

Part 71 - Areal Robust regression Gaussian filter

• Microroughness S-Filter on stratified and structured surfaces
• L-Filter for the generation of the roughness S-L surface on stratified and structured surfaces
• F-Filter for the generation of S-F surface
• Outlier detection

Part 81 - Areal Morphological filter

• F-Filter used to flatten a surface with the upper or lower envelope
• Tip deconvolution of AFM instrument

Part 85 - Areal Segmentation filter

• Identification of structures (grains, pores, cells, ...)
• Automatic leveling of MEMS

Part 89 - Areal Scale space technique

• ISO 25178: areal surface texture standard
• Surface roughness
• Gaussian filter

• BAKUCZ P, 2013, Spline filtering in accordance to ISO/TS 16610: ANSI C-code for engineers, 8th IEEE conf. on applied comput. intel. informatics
• BAKUCZ P, KRÜGER-SEHM R, 2009, A new wavelet filtering for analysis of fractal engineering surfaces, Wear
• BLATEYRON F, 2014, Good practices for the use of areal filters, 3rd Seminar on surface metrology of the Americas, Albuquerque.
• BRINKMANN S, BODSCHWINNA H, LEMKE H W, 2001, Accessing roughness in three-dimensions using Gaussian regression filtering, Int. J of mach. tools manuf.
• DEMIRCI I, MEZGHANI S, YOUSFI M, EL MANSORI M, 2013, Multiscale analysis of the roughness effect on lubricated rough contact, J of tribology
• DOBRZANSKI P, PAWLUS P, 2010, Digital filtering of surface topography: part II, applications of robust and valley suppression filters, Prec. eng., 01/2010
• FRIIS K S, GODI A, DE CHIFFRE L, 2011, Characterization and robust filtering of multifunctional surfaces using ISO standards, Meas. sci. technol. 22 125101
• GOTO T, MIYAKURA J, UMEDA K, KADOWAKI S, 2005, A robust spline filter on the basis of L2-norm, Prec. eng.
• GURAU L, IRLE M, MANSFIELD-WILLIAMS H, 2013, Minimising the computation time of using a robust Gaussian regression filter on sanded wood surfaces, Pro Ligno, 8(3):3-11
• HANADA H, SAITO T, HASEGAWA M, YANAGI K, 2008, Sophisticated filtration technique for 3D surface topography data of rectangular area, Wear, 264(5):422-427
• JIANG X, SCOTT P J, WHITEHOUSE D, 2008, Wavelets and their applications for surface metrology, CIRP Annals manuf. tech., 57:555-558
• KONDO Y, NUMADA M, KOSHIMIZU H, 2014, A robust Gaussian filter corresponding to the transmission characteristic of the Gaussian filter, J of physics conf. series, 483(1):012016.
• KRYSTEK M, 2010, ISO filters in precision engineering and production measurement, Meas. sci. technol.
• KRYSTEK M, 2005, Spline filters for surface texture analysis, Key eng. materials
• KRYSTEK M, 1996, A fast gauss filtering algorithm for roughness measurements, Prec. eng.
• KUMAR J, SHUNMUGAM M S, 2006, A new approach for filtering surface profiles using morphological operations, Int. J of mach. tools manuf., 46(3):260-270
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• LINGADURAI K, SHUNMUGAM M S, 2006, Metrological characteristics of wavelet filters used for engineering surfaces, Measurements
• LINGADURAI K, SHUNMUGAM M S, 2005, Use of morphological closing filters for three-dimensional filtering of engineering surfaces, J of manuf. syst., 24(4):366-376
• LIU X, RAJA J, 1996, Analyzing engineering surface texture using wavelet filter, Proc. SPIE
• LOU S, JIANG X, SCOTT P J, 2013, Correlating motif analysis and morphological filters for surface texture analysis, Measurement, 46(2):993-1001, ISSN 0263-2241
• LOU S, JIANG X, SCOTT P J, 2012, Algorithms for morphological profile filters and their comparison, Prec. Eng., 36(3):414-423
• MURALIKRISHNAN B, REN W, STANFIELD E, EVERETT D, ZHENG A, DOIRON T, 2013, Applications of profile filtering in the dimensional metrology of fuel cell plates, Meas. sci. technol. 24 065003
• NUMADA M, NOMURA T, YANAGI K, KAMIYAMA K, TASHIRO H, 2007, High-order spline filter and ideal low-pass filter at the limit of its order, Prec. eng.
• PODULKA P, PAWLUS P, DOBRZANSKI P, LENART A, 2014, Spikes removal in surface measurement, J of physics conf. series, 483(1):012025
• RAJA J, MURALIKRISHNAN B, FU S, 2002, Recent advances in separation of roughness, waviness and form, Prec. eng.
• SEEWIG J, EIFER M, 2014, Periodic Gaussian filter according to ISO 16610-21 for closed profiles, Prec. Eng. 38(2):439-442.
• SEEWIG J, 2005, Linear and robust Gaussian regression filters, J of physics conf. series, 13(1):254
• THOLATH J, RADHAKRISHNAN V, 1999, Three-dimensional filtering of engineering surfaces using envelope system, Prec. eng., 23:221-228
• VERMEULEN M, SCHEERS J, 2000, Robust filtering applied to sheet metal surfaces, Xth Int. coll. on surfaces, Chemnitz
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• XIN B, 2009, Multiscale analysis of rough groove textures for three-dimensional optical measurements, Opt. eng., 48(7)
• YUAN Y, VORBURGER T V, SONG J F, RENEGAR T B, 2000, A simplified realization for the Gaussian filter in surface metrology, Xth Int. coll. on surfaces, Chemnitz
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• ZENG W, JIANG X, SCOTT P J, 2011, A generalised linear and nonlinear spline filter, Wear, 271:544-547
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• ZHANG H, YUAN Y, PIAO W A, 2010, Universal spline filter for surface metrology, Measurement, 43(10):1575-1582